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Hier mal der Output von smartmontools:
smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.0.0-12-generic] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: SAMSUNG SpinPoint P120
Device Model: SAMSUNG SP2504C
Serial Number: S09QJ1HL959383
Firmware Version: VT100-50
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 4a
Local Time is: Mon Oct 24 19:56:26 2011 CEST
==> WARNING: May need -F samsung3 enabled; see manual for details.
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4819) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 090 051 Pre-fail Always - 167
3 Spin_Up_Time 0x0007 253 253 025 Pre-fail Always - 5952
4 Start_Stop_Count 0x0032 095 095 000 Old_age Always - 5495
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 7
7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 13107
10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0012 253 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 098 098 000 Old_age Always - 2984
187 Reported_Uncorrect 0x0032 062 062 000 Old_age Always - 16515111
190 Airflow_Temperature_Cel 0x0022 127 088 000 Old_age Always - 37
194 Temperature_Celsius 0x0022 127 088 000 Old_age Always - 37
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 217528706
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 7
197 Current_Pending_Sector 0x0012 253 253 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0
201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
202 Data_Address_Mark_Errs 0x0032 253 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 18 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 18 occurred at disk power-on lifetime: 12652 hours (527 days + 4 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 60 00 61 c8 e9 Error: UNC 96 sectors at LBA = 0x09c86100 = 164126976
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 60 00 61 c8 e9 00 03:42:46.250 READ DMA
c8 00 70 a0 62 48 ef 00 03:42:44.750 READ DMA
c8 00 60 a0 5d 48 ef 00 03:42:44.750 READ DMA
c8 00 38 08 59 48 ef 00 03:42:44.750 READ DMA
c8 00 60 58 58 48 ef 00 03:42:44.750 READ DMA
Error 17 occurred at disk power-on lifetime: 11931 hours (497 days + 3 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 40 20 1e c9 e9 Error: UNC 64 sectors at LBA = 0x09c91e20 = 164175392
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 40 20 1e c9 e9 00 03:50:39.063 READ DMA
c8 00 20 00 1e c9 e9 00 03:50:38.875 READ DMA
ca 00 70 c8 58 ca e9 00 03:50:32.313 WRITE DMA
ca 00 90 48 44 c5 e9 00 03:50:32.313 WRITE DMA
ca 00 a0 a0 42 c5 e9 00 03:50:32.313 WRITE DMA
Error 16 occurred at disk power-on lifetime: 11817 hours (492 days + 9 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 50 29 c5 ef Error: UNC 8 sectors at LBA = 0x0fc52950 = 264579408
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 50 29 c5 ef 00 00:41:57.063 READ DMA
c8 00 10 50 0c cb ef 00 00:41:56.750 READ DMA
c8 00 28 60 40 da ef 00 00:41:56.750 READ DMA
c8 00 b8 58 06 f3 ef 00 00:41:56.750 READ DMA
c8 00 08 e8 74 ca ef 00 00:41:56.688 READ DMA
Error 15 occurred at disk power-on lifetime: 11817 hours (492 days + 9 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
01 51 20 00 97 d9 ef Error: AMNF 32 sectors at LBA = 0x0fd99700 = 265918208
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 20 00 97 d9 ef 00 00:41:26.563 READ DMA
c8 00 08 c8 46 c5 e9 00 00:41:26.375 READ DMA
c8 00 08 d8 46 c5 e9 00 00:41:26.313 READ DMA
c8 00 08 68 a4 93 eb 00 00:41:26.313 READ DMA
c8 00 08 08 42 c5 e9 00 00:41:26.313 READ DMA
Error 14 occurred at disk power-on lifetime: 11817 hours (492 days + 9 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 b0 a0 61 e1 ef Error: UNC 176 sectors at LBA = 0x0fe161a0 = 266428832
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 b0 a0 61 e1 ef 00 00:41:17.938 READ DMA
c8 00 90 c0 6d e0 ef 00 00:41:17.750 READ DMA
c8 00 80 e0 64 e1 ef 00 00:41:17.750 READ DMA
c8 00 20 e0 62 e0 ef 00 00:41:17.688 READ DMA
c8 00 48 98 40 ce ef 00 00:41:17.625 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 13107 -
# 2 Extended offline Completed without error 00% 13099 -
Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Festplatte scheint also ok zu sein.
Wie bereits im ersten Post erwähnt, läuft Memtest 3-4 Stunden fehlerfrei durch. Bei der LiveCD tauchen die Kernelpanics auch auf - zumindest wenn die Festplatte gemountet ist. Ohne gemountete Festplatte kann ich im Moment mangels Zeit nicht testen.