Habe mir eine Gebraucht SSD gekauft und nun bin ich mir nicht sicher, wie vertrauenswürdig diese ist Auch 177 Wear_Leveling_Count hat einen raw value von 36. Das Samsung eigene Testprogramm unterstützt diese SSD leider nicht, zu alt.
Model Family: Samsung based SSDs Device Model: SAMSUNG SSD PM810 2.5" 7mm 128GB Serial Number: S0NRNEAB911810 LU WWN Device Id: 5 0000f0 000000000 Firmware Version: AXM08D1Q User Capacity: 128,035,676,160 bytes [128 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 1 SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s) Local Time is: Thu Feb 8 15:58:12 2018 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 840) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 14) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 099 099 --- - 6 9 Power_On_Hours -O--CK 098 098 --- - 8195 12 Power_Cycle_Count -O--CK 099 099 --- - 881 175 Program_Fail_Count_Chip -O--CK 099 099 --- - 4 176 Erase_Fail_Count_Chip -O--CK 100 100 --- - 0 177 Wear_Leveling_Count PO--C- 099 099 --- - 36 178 Used_Rsvd_Blk_Cnt_Chip PO--C- 078 078 --- - 430 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 079 079 --- - 846 180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 079 079 --- - 3186 181 Program_Fail_Cnt_Total -O--CK 099 099 --- - 6 182 Erase_Fail_Count_Total -O--CK 100 100 --- - 0 183 Runtime_Bad_Block PO--C- 099 099 --- - 6 187 Uncorrectable_Error_Cnt -O--CK 084 084 --- - 15676 195 ECC_Error_Rate -O-RC- 001 001 --- - 15676 198 Offline_Uncorrectable ----CK 100 100 --- - 0 199 CRC_Error_Count -OSRCK 253 253 --- - 0 232 Available_Reservd_Space PO--C- 078 078 --- - 1586 241 Total_LBAs_Written -O--CK 022 022 --- - 3358715156 242 Total_LBAs_Read -O--CK 092 092 --- - 343629591 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning